Please use this identifier to cite or link to this item: http://13.232.72.61:8080/jspui/handle/123456789/2024
Title: Influence of Zn2+ doping on the lattice defects and photoluminescence studies of Sr2CeO4:Eu3+ nanophosphor: Applications for data encryption strategies
Authors: Sudheendra, H. S.
Darshan, G. P.
Basavaraj, R. B.
Naik, Y. V.
Premakumar, H. B.
Nagabhushana, H.
Williams, J. F.
Hareesh, K.
Kokila, M. K.
Keywords: Ultrasonication route
Positron annihilation spectroscopy
Doppler broadening spectroscopy
Luminescent chalk
Photoluminescence
Issue Date: 2019
Publisher: ELSEVIER
Citation: Sudheendra, H. S., Darshan, G. P., Basavaraj, R. B., Naik, Y. V., Premakumar, H. B., Nagabhushana, H., ... & Kokila, M. K. (2019). Influence of Zn2+ doping on the lattice defects and photoluminescence studies of Sr2CeO4: Eu3+ nanophosphor: Applications for data encryption strategies. Optical Materials, 90, 159-171.
Abstract: In the present work, luminescent Sr2CeO4:Eu3+ (5 mol %), Zn2+ (0.25–3 mol %) nanophosphors were fabricated by the ultrasound irradiated sonochemical method. The samples prepared with 3 h ultrasound treatment exhibit well crystalline and single phase Sr2CeO4. The dumbbell shaped morphology of the prepared samples was elucidated from both SEM and TEM results. The energy band gap of the prepared samples was estimated and found to be in the range ∼3.18–3.63 eV. The incorporation of Zn2+ greatly influences the defect and emission intensities, as revealed from photoluminescence and positron lifetime spectroscopy measurements. The enhancement in the photoluminescence emission intensity after Zn2+ incorporation was observed, which may be due to the creation of defects and efficient energy transfer between Zn2+ and Eu3+ or defects that can act as emission centers. The positron lifetime spectroscopy qualitatively explains the concentration of defects (vacancy and voids) which are induced by Zn2+ co-doping. The encryption strategies are provided using the photoluminescent chalk for high level information protection. We believe that the versatile, convenient and userfriendly strategy demonstrated herein will open a new insight for on-site information protection.
URI: http://13.232.72.61:8080/jspui/handle/123456789/2024
ISSN: 0925-3467
Appears in Collections:Faculty of Science

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