Please use this identifier to cite or link to this item:
http://13.232.72.61:8080/jspui/handle/123456789/588| Title: | Radiation Effects in Semiconductors. |
| Authors: | Iniewski, Krzysztof |
| Keywords: | Aeronautical Automatic control Devices. |
| Issue Date: | 2011 |
| Publisher: | CRC Press, Taylor & Francis Group. |
| Citation: | Iniewski, Krzysztof. (2011). Radiation effects in semiconductors. Retrieved from http://www.crcpress.com. |
| Abstract: | The operations of silicon detectors are progressively degraded by radiation, ultimately leading to their failure. The radiation damage mechanism in the sensors can be divided in two classes: surface and bulk damage. |
| Description: | USE ONLY FOR ACADEMY PURPOSE. |
| URI: | https://books.google.co.in/books?id=zO6C4fcY7WIC&pg=PR4&lpg=PR4&dq=978-1-4398-2694-2&source=bl&ots=fjLAcMAuMs&sig=p7e0j1KLjrmi0810tdD5PPEmlkk&hl=en&sa=X&ved=2ahUKEwjuy7it7JHfAhUF3o8KHYhFDCcQ6AEwAXoECAoQAQ#v=onepage&q=978-1-4398-2694-2&f=false http://13.232.72.61:8080/jspui/handle/123456789/588 |
| ISBN: | 978-1-4398-2694-2 |
| Appears in Collections: | E books |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Radiation Effects in Semiconductors.pdf | 18.88 MB | Adobe PDF | View/Open |
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