Please use this identifier to cite or link to this item:
http://13.232.72.61:8080/jspui/handle/123456789/588Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Iniewski, Krzysztof | - |
| dc.date.accessioned | 2018-12-09T03:55:33Z | - |
| dc.date.available | 2018-12-09T03:55:33Z | - |
| dc.date.issued | 2011 | - |
| dc.identifier.citation | Iniewski, Krzysztof. (2011). Radiation effects in semiconductors. Retrieved from http://www.crcpress.com. | en_US |
| dc.identifier.isbn | 978-1-4398-2694-2 | - |
| dc.identifier.uri | https://books.google.co.in/books?id=zO6C4fcY7WIC&pg=PR4&lpg=PR4&dq=978-1-4398-2694-2&source=bl&ots=fjLAcMAuMs&sig=p7e0j1KLjrmi0810tdD5PPEmlkk&hl=en&sa=X&ved=2ahUKEwjuy7it7JHfAhUF3o8KHYhFDCcQ6AEwAXoECAoQAQ#v=onepage&q=978-1-4398-2694-2&f=false | - |
| dc.identifier.uri | http://13.232.72.61:8080/jspui/handle/123456789/588 | - |
| dc.description | USE ONLY FOR ACADEMY PURPOSE. | en_US |
| dc.description.abstract | The operations of silicon detectors are progressively degraded by radiation, ultimately leading to their failure. The radiation damage mechanism in the sensors can be divided in two classes: surface and bulk damage. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | CRC Press, Taylor & Francis Group. | en_US |
| dc.subject | Aeronautical | en_US |
| dc.subject | Automatic control | en_US |
| dc.subject | Devices. | en_US |
| dc.title | Radiation Effects in Semiconductors. | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | E books | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Radiation Effects in Semiconductors.pdf | 18.88 MB | Adobe PDF | View/Open |
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